Skip to main navigation Skip to search Skip to main content

On modeling of substrate/buffer loading in GaN HEMT using grey-Wolf optimization technique

  • University of Sharjah

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

In this paper, four different equivalent circuit models to describe substrate/buffer loading effect in GaN HEMT on Si substrate have been investigated. The effect is characterized by Z-parameter measurements of open de-embedding structure for the considered device. A meta-heuristic optimization techniques of Grey-Wolf has been utilized to extract optimal values for the model elements. The models are validated by comparing their simulation results with the measured data. The extraction results are evaluated in terms of their accuracy and rate of convergence.

Original languageEnglish
Title of host publication2019 8th International Conference on Modeling Simulation and Applied Optimization, ICMSAO 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538676844
DOIs
StatePublished - Apr 2019
Event8th International Conference on Modeling Simulation and Applied Optimization, ICMSAO 2019 - Manama, Bahrain
Duration: 15 Apr 201917 Apr 2019

Publication series

Name2019 8th International Conference on Modeling Simulation and Applied Optimization, ICMSAO 2019

Conference

Conference8th International Conference on Modeling Simulation and Applied Optimization, ICMSAO 2019
Country/TerritoryBahrain
CityManama
Period15/04/1917/04/19

Keywords

  • GaN HEMT
  • Grey Wolf Optimizer
  • Open de-embedding structure

Fingerprint

Dive into the research topics of 'On modeling of substrate/buffer loading in GaN HEMT using grey-Wolf optimization technique'. Together they form a unique fingerprint.

Cite this